Microcontactor (SCP Series)

The SCP series is a type of contact probes used in semiconductor inspection equipment. It realizes low resistance thanks to our unique coiling technology.

Microcontactor (HCP Series)

The HCP series is a type of contact probes used in semiconductor inspection equipment to improve electrical stability.

Microcontactor (NIC Series)

NIC series contact probes, used in semiconductor inspection equipment, have high-frequency characteristics.

Microcontactor (AZT Series)

The AZT series is a type of contact probes used in semiconductor inspection equipment. It realizes contact position accuracy improves.

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Contact Probes Tip Shape

Our contact probes “Microcontactor” can be processed into various tip shapes to suit semiconductor products.

We are able to perform the entire process from tip shape design to processing in our own factory, and we can also propose special shapes to meet customer needs.